THz spectroscopy and source characterization by optoelectronic interferometry
نویسندگان
چکیده
منابع مشابه
THz spectroscopy and source characterization by optoelectronic interferometry
Recently, many new optoelectronic sources of freely propagating THz radiation have been demonstrated. l-l4 Common to all these sources has been the problem to properly characterize the emitted THz radiation with receivers of limited bandwidths. The broadest bandwidth receivers have used ion-implanted, silicon-on-sapphire (SOS), photoconductive switches. In general, the limiting response of phot...
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ژورنال
عنوان ژورنال: Applied Physics Letters
سال: 1992
ISSN: 0003-6951,1077-3118
DOI: 10.1063/1.106447